The TFG710S takes FG710S Technology even further. Its patented
design uses a combination of near-infrared and mid-infrared energy
to achieve thickness measurements of very thin biax and cast
films.
Unlike nucleonic devices used for this challenging application,
it is insensitive to humidity, barometric pressure, or gap
temperature and there is no radioactive source capsule to replace
every two years in order to maintain accuracy. Because the
wavelength of the NIR and MIR light energy is very close to the
thickness of very thin plastic films, a phenomenon called optical
fringe interference (OFI) can occur. OFI can have a devastating
effect on measurement accuracy, making a standard NIR sensor
practically unusable for these products. The TFG710S sensor employs
a patented technique that cancels the effect of optical
interference, allowing the sensor to make highly accurate
measurement even of films less than 2 microns thick.
TFG710S Features:
- Designed specifically for cast and biax
films
- True thickness measurement of thin film products
(down to 2 µm or less)
- Provides real-time measurement (first scan)
- Immune to optical fringe interference
- Insensitive to changes in pass-line,
temperature, humidity, haze, or orientation
- Built-in insensitivity to flutter, scanner
mechanical run-out
- Order of magnitude more accurate than PM-147
beta sensors
- Ten times faster response than traditional
NIR sensors
- Multi-component measurement discrimination
- Simple to calibrate, requiring no special tools
or skills
- Large (3 inch) measuring gap
- Non-nuclear sensor requires no special
licensing, handling or testing procedures
To learn more about how the NDC TFG710S can help improve your
production quality, contact your local representative using the
Contact Us feature, or use the
Request Information link to send us an
email with your requirements.